DOI: https://doi.org/10.35681/1560-9189.2018.20.4.178531

Молекулярний аналіз тонких плівок різної природи на основі спектроскопії поверхневих плазмонів

S. O. Kostyukevych, R. V. Khrystosenko, K. V. Kostyukevych, A. A. Koptyukh, O. R. Surovtseva, A. A. Kryuchyn

Анотація


Досліджено процеси формування та структуру тонких плівок халькогенідного склоподібного напівпровідника As2S3, полімеру поліаніліну (ПАНІ) та білка фібриногену (ФБ) на поверхні плівок благородних металів (Ag, Au) з використанням методики призмового збудження поверхневого плазмонного резонансу (ППР) у поєднанні з атомно-силовою мікроскопією. Оптичні параметри шарів As2S3 та ПАНІ визначено при підганянні експериментальних і розрахованих резонансних кривих ППР методом мінімізації цільової функції. Властивості плівок ФБ, що отримані з розчину білка у фосфатному буфері при різних концент-раціях (9,3–300 muг/мл), вивчено на основі аналізу кінетичних ППР-кривих адсорбції ФБ і його DD- і E-фрагментів з наступним зондуванням моноклональними антитілами.

Ключові слова


поверхневий плазмонний резонанс; тонкі плівки; халькогенідний склоподібний напівпровідник; поліанілін; фібриноген; моно-клональні антитіла

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Посилання


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